
About the conference
Jena LIGHT Conference 2005 Titelbild
Optische Baugruppe für satellitengestütztes Klimawandel-Monitoring
Foto: Fraunhofer IOFTopics
- New PIC materials and hybrid material systems for integrated light sources, quantum systems, ultrafast switching, and detectors
- Waferscale active and switchable platforms for photonic integrated circuits
- Characterization tools: scalability, standardization, subwavelength, rapid characterization
- Co-integration of electronic and photonic solutions on chip and on the wafer scale
- Novel trends in PIC-design from components to architectures: machine learning, AI, PDKs and simulation tools
- Applications in telecommunication, photonic computing, AI, and quantum science
- New concepts for guided wave architectures: From metasurfaces to atom scale materials